Title :
Classification via semi-Riemannian spaces
Author :
Zhao, Deli ; Lin, Zhouchen ; Tang, Xiaoou
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong
Abstract :
In this paper, we develop a geometric framework for linear or nonlinear discriminant subspace learning and classification. In our framework, the structures of classes are conceptualized as a semi-Riemannian manifold which is considered as a submanifold embedded in an ambient semi-Riemannian space. The class structures of original samples can be characterized and deformed by local metrics of the semi-Riemannian space. Semi-Riemannian metrics are uniquely determined by the smoothing of discrete functions and the nullity of the semi-Riemannian space. Based on the geometrization of class structures, optimizing class structures in the feature space is equivalent to maximizing the quadratic quantities of metric tensors in the semi-Riemannian space. Thus supervised discriminant subspace learning reduces to unsupervised semi-Riemannian manifold learning. Based on the proposed framework, a novel algorithm, dubbed as semi-Riemannian discriminant analysis (SRDA), is presented for subspace-based classification. The performance of SRDA is tested on face recognition (singular case) and handwritten capital letter classification (nonsingular case) against existing algorithms. The experimental results show that SRDA works well on recognition and classification, implying that semi-Riemannian geometry is a promising new tool for pattern recognition and machine learning.
Keywords :
image classification; learning (artificial intelligence); tensors; ambient semi-Riemannian space; face recognition; handwritten capital letter classification; machine learning; metric tensors; nonlinear classification; nonlinear discriminant subspace learning; pattern recognition; semi-Riemannian discriminant analysis; supervised discriminant subspace learning; Asia; Covariance matrix; Geometry; Linear discriminant analysis; Manifolds; Pattern recognition; Performance analysis; Principal component analysis; Scattering; Smoothing methods;
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2008.4587346