Built-in high resolution signal generator for testing ADC and DAC

Author

Chang, Yeong-Jar ; Chang, Soon-Jyh ; Ho, Jung-Chi ; Ong, Chee-Kiau ; Cheng, Ting ; Wu, Wen-Ching

Author_Institution

SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu, Taiwan

fYear

2003

fDate

2003

Firstpage

231

Lastpage

234

Abstract

This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in asymmetry digital subscriber line system on a chip (ADSL SoC).

Keywords

built-in self test; delta-sigma modulation; digital subscriber lines; integrated circuit testing; ramp generators; sigma-delta modulation; system-on-chip; ADC; DAC; SoC; analog-digital converter testing; asymmetry digital subscriber line; built-in high resolution signal generator; digital-analog converter testing; sigma-delta demodulator; system-on-chip; Analog-digital conversion; Circuit testing; DSL; Delta-sigma modulation; Demodulation; Digital-analog conversion; Signal design; Signal generators; Signal resolution; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications, 2003 International Symposium on

ISSN

1524-766X

Print_ISBN

0-7803-7765-6

Type

conf

DOI

10.1109/VTSA.2003.1252595

Filename

1252595