• DocumentCode
    2395269
  • Title

    Analysis of H-plane waveguide discontinuities using hybrid multimode contour integral and mode matching techniques

  • Author

    Hashemi, Ali ; Banai, Ali

  • Author_Institution
    IAU-Majlesi Branch, Esfahan
  • fYear
    2007
  • fDate
    Oct. 29 2007-Nov. 1 2007
  • Firstpage
    840
  • Lastpage
    843
  • Abstract
    new hybrid method based on multimode contour integral and mode matching techniques will be introduced. It is capable of analyzing any H-plane discontinuity in a rectangular waveguide. The process is based on segmentation and dividing the structure into key building blocks. We use the multimode contour integral method to analyze the blocks including irregular shape H-plane discontinuities. In opposite to traditional contour integral method, which considers only the effect of dominant mode (TE10) on wave ports, multimode contour integral considers the effect of higher order modes (TEn0) excited by discontinuities on these ports. The mode matching technique will be used to analyze the connecting blocks which can be easily treated by modal expansion. Then the generalized scattering matrix (GSM) of the whole structure can be found by cascading the blocks.The accuracy of our purposed method is validated by comparison with results obtained by other methods.
  • Keywords
    S-matrix theory; integral equations; mode matching; rectangular waveguides; waveguide discontinuities; H-plane waveguide discontinuities; generalized scattering matrix; hybrid multimode contour integral; modal expansion; mode matching techniques; rectangular waveguide; Central Processing Unit; Circuit analysis; GSM; Joining processes; Microwave circuits; Rectangular waveguides; Scattering; Shape; Transmission line matrix methods; Waveguide discontinuities; GSM; H-plane discontinuity; Multimode contour integral; mode matching; rectangular waveguide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 2007. IMOC 2007. SBMO/IEEE MTT-S International
  • Conference_Location
    Brazil
  • Print_ISBN
    978-1-4244-0661-6
  • Electronic_ISBN
    978-1-4244-0661-6
  • Type

    conf

  • DOI
    10.1109/IMOC.2007.4404388
  • Filename
    4404388