DocumentCode :
2395708
Title :
Analysis of a x-cut Ti:LiNbO3 electrooptic modulator with a ridge structure
Author :
Abe, Nancy M. ; Franco, Marcos A R ; Passaro, Angelo
Author_Institution :
Div. of Appl. Phys., Centro Tecnico Aeroespacial, Brazil
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
144
Abstract :
An analysis of a Ti:LiNbO3 Mach-Zehnder traveling-wave electrooptic modulator with a ridge structure is presented in this work. The performance of the device is studied assuming x-cut substrate. Two configurations employing ridge structure are compared to a conventional one. This work also presents the influence of some fabrication parameters of the optical waveguide on the factors which evaluates the efficiency of the modulators. The characteristics of both the optical waveguide and the coplanar waveguide electrode are computed applying the scalar finite element method
Keywords :
Mach-Zehnder interferometers; electro-optical modulation; finite element analysis; integrated optics; lithium compounds; optical waveguide components; ridge waveguides; titanium; LiNbO3:Ti; Ti:LiNbO3 Mach-Zehnder traveling-wave electro-optic modulator; coplanar waveguide electrode; fabrication; optical waveguide; ridge structure; scalar finite element method; x-cut substrate; Coplanar waveguides; Electrodes; Electrooptic modulators; Optical buffering; Optical device fabrication; Optical modulation; Optical refraction; Optical signal processing; Optical variables control; Optical waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Optoelectronics Conference, 1999. SBMO/IEEE MTT-S, APS and LEOS - IMOC '99. International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-5807-4
Type :
conf
DOI :
10.1109/IMOC.1999.867076
Filename :
867076
Link To Document :
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