Development of Metal Inspection System Exploiting Magnetoresistive Sensors

Author

Elshafiey, Ibrahim ; Mohra, Ashraf

Author_Institution

Dept. of Electr. Eng., King Saud Univ., Riyadh

fYear

2006

fDate

Dec. 2006

Firstpage

152

Lastpage

155

Abstract

Advances in magnetoresistive (MR) type sensors provide a new technique for nondestructive evaluation NDE of metal structures. MR sensors include high sensitivity and reduced size being produced by thin film processing techniques, the manufacturing cost of these sensors is low. This paper provides an attempt to develop an NDE system that depends on one type of MR sensors, namely the giant MR (GMR) elements. An example is considered of detecting defects in printed circuit boards. System details and experimental results are provided. Computational modeling validation is introduced based on finite element analysis

Keywords

finite element analysis; giant magnetoresistance; magnetoresistive devices; nondestructive testing; printed circuits; finite element analysis; giant magnetoresistive sensors; metal inspection system; metal structures; nondestructive evaluation; printed circuit boards; thin film processing; Computational modeling; Costs; Giant magnetoresistance; Inspection; Magnetic sensors; Manufacturing processes; Printed circuits; Sensor systems; Thin film circuits; Thin film sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

System-on-Chip for Real-Time Applications, The 6th International Workshop on

Conference_Location

Cairo

Print_ISBN

1-4244-0898-9

Type

conf

DOI

10.1109/IWSOC.2006.348226

Filename

4155279