• DocumentCode
    2396104
  • Title

    The statistical modelling of fingerprint minutiae distribution with implications for fingerprint individuality studies

  • Author

    Chen, Jiansheng ; Moon, Yiu-Sang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The spatial distribution of fingerprint minutiae is a core problem in the fingerprint individuality study, the cornerstone of the fingerprint authentication technology. Previously, the assumption in most research that minutiae distribution is random has been proved to be inaccurate and may lead to significant overestimates of fingerprint uniqueness. In this paper, we propose a stochastic model for describing and simulating fingerprint minutiae patterns. Through coupling a pair potential Markov point process with a thinned process, this model successfully depicts the complex statistical behavior of fingerprint minutiae. Parameters of this model can be determined by nonlinear minimization. Furthermore, experiment results show that the statistical properties of our proposed model dovetails nicely with real minutiae data in terms of the false fingerprint correspondence probability. Such evidences indicate that the proposed model is a more accurate foundation for minutiae based fingerprint individuality studies as well as the artificial fingerprint synthesis when compared to the model of random distribution.
  • Keywords
    Markov processes; fingerprint identification; random processes; statistical distributions; Markov point process; fingerprint authentication technology; fingerprint individuality studies; fingerprint minutiae distribution; nonlinear minimization; random distribution; spatial distribution; statistical modelling; statistical properties; stochastic model; thinned process; Authentication; Biometrics; Computer science; Fingerprint recognition; Humans; Moon; Probability; Stability analysis; Stochastic processes; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587399
  • Filename
    4587399