DocumentCode
2396104
Title
The statistical modelling of fingerprint minutiae distribution with implications for fingerprint individuality studies
Author
Chen, Jiansheng ; Moon, Yiu-Sang
Author_Institution
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
fYear
2008
fDate
23-28 June 2008
Firstpage
1
Lastpage
7
Abstract
The spatial distribution of fingerprint minutiae is a core problem in the fingerprint individuality study, the cornerstone of the fingerprint authentication technology. Previously, the assumption in most research that minutiae distribution is random has been proved to be inaccurate and may lead to significant overestimates of fingerprint uniqueness. In this paper, we propose a stochastic model for describing and simulating fingerprint minutiae patterns. Through coupling a pair potential Markov point process with a thinned process, this model successfully depicts the complex statistical behavior of fingerprint minutiae. Parameters of this model can be determined by nonlinear minimization. Furthermore, experiment results show that the statistical properties of our proposed model dovetails nicely with real minutiae data in terms of the false fingerprint correspondence probability. Such evidences indicate that the proposed model is a more accurate foundation for minutiae based fingerprint individuality studies as well as the artificial fingerprint synthesis when compared to the model of random distribution.
Keywords
Markov processes; fingerprint identification; random processes; statistical distributions; Markov point process; fingerprint authentication technology; fingerprint individuality studies; fingerprint minutiae distribution; nonlinear minimization; random distribution; spatial distribution; statistical modelling; statistical properties; stochastic model; thinned process; Authentication; Biometrics; Computer science; Fingerprint recognition; Humans; Moon; Probability; Stability analysis; Stochastic processes; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location
Anchorage, AK
ISSN
1063-6919
Print_ISBN
978-1-4244-2242-5
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2008.4587399
Filename
4587399
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