DocumentCode :
2396399
Title :
Robust higher order potentials for enforcing label consistency
Author :
Kohli, Pushmeet ; Ladický, L´ubor ; Torr, Philip H S
Author_Institution :
Microsoft Res. Cambridge, Cambridge, MA
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
8
Abstract :
This paper proposes a novel framework for labelling problems which is able to combine multiple segmentations in a principled manner. Our method is based on higher order conditional random fields and uses potentials defined on sets of pixels (image segments) generated using unsupervised segmentation algorithms. These potentials enforce label consistency in image regions and can be seen as a strict generalization of the commonly used pairwise contrast sensitive smoothness potentials. The higher order potential functions used in our framework take the form of the robust Pn model. This enables the use of powerful graph cut based move making algorithms for performing inference in the framework [14 ]. We test our method on the problem of multi-class object segmentation by augmenting the conventional CRF used for object segmentation with higher order potentials defined on image regions. Experiments on challenging data sets show that integration of higher order potentials quantitatively and qualitatively improves results leading to much better definition of object boundaries. We believe that this method can be used to yield similar improvements for many other labelling problems.
Keywords :
image segmentation; object recognition; conditional random fields; higher order potential functions; label consistency; move making algorithms; multiclass object segmentation; multiple segmentations; object boundaries; powerful graph cut; unsupervised segmentation algorithms; Image generation; Image resolution; Image segmentation; Inference algorithms; Labeling; Object segmentation; Pixel; Robustness; Stereo image processing; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
ISSN :
1063-6919
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2008.4587417
Filename :
4587417
Link To Document :
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