DocumentCode
2396630
Title
Parallel Genetic Algorithm of Test Generation For Digital Circuits
Author
Skobtsov, Y.A. ; El-Khatib, A.I. ; Ivanov, D.E.
Author_Institution
Donetsk Nat. Tech. Univ., Donetsk
fYear
2006
fDate
Feb. 28 2006-March 4 2006
Firstpage
129
Lastpage
131
Abstract
The parallel genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.
Keywords
digital circuits; genetic algorithms; integrated circuit testing; digital circuits; parallel genetic algorithm; test generation; Automatic testing; Circuit testing; Data processing; Digital circuits; Electronics packaging; Genetic algorithms; Genetic programming; Logic testing; Parallel processing; Sequential circuits; digital circuits; genenic algorithms; parallel calculations; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference
Conference_Location
Lviv-Slavsko
Print_ISBN
966-553-507-2
Type
conf
DOI
10.1109/TCSET.2006.4404471
Filename
4404471
Link To Document