Power semiconductor switching losses experimental characterization system

With the current quest for ever more efficient, smaller and better power converters, the role of the power semiconductors becomes very important. Increasing switching frequencies seems key to the development of this area. This is based on the steady development of semiconductor switching devices, in which switching losses is perhaps the most important figure in the mentioned context. Thus, the accurate characterization of such losses leads to optimized converter designs. This work presents the practical development of a flexible test system that aims in the reduction of lab test time to perform switching losses measurements.