DocumentCode :
2397205
Title :
Time redundancy for error detecting neural networks
Author :
Hsu, Yuang-Ming ; Piuri, Vincenzo ; Swartzlander, Earl E., Jr.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear :
1995
fDate :
18-20 Jan 1995
Firstpage :
111
Lastpage :
121
Abstract :
Concurrent error detection at an architectural level is often a basic requirement to achieve fault tolerance in neural networks for mission-critical applications. Time redundancy allows for concurrent error detection with low circuit complexity. In this paper, the use of alternating logic and complemented logic are analyzed as low-cost approaches to concurrent error detection. Different architectural approaches for the neural network design are considered to march the implementation constraints
Keywords :
error detection; fault tolerant computing; neural net architecture; neural nets; redundancy; alternating logic; circuit complexity; complemented logic; concurrent error detection; fault tolerance; mission-critical applications; neural network architecture; time redundancy; Circuit faults; Complexity theory; Computer errors; Computer networks; Error correction; Fault detection; Logic; Mission critical systems; Neural networks; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2467-6
Type :
conf
DOI :
10.1109/ICWSI.1995.515444
Filename :
515444
Link To Document :
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