DocumentCode
2397334
Title
A wafer-scale ATM switching system based on the Manhattan-street network
Author
Mirfakhraei, Nader
Author_Institution
Comput. & Commun. Res. Center, Washington Univ., St. Louis, MO, USA
fYear
1995
fDate
18-20 Jan 1995
Firstpage
182
Lastpage
190
Abstract
This paper presents a defect-tolerant wafer-scale switching system for highspeed ATM communication applications. The network topology is based on the Manhattan-street Network (MSN) which has a torus structure. In the MSN, a cell is temporarily misrouted (deflected) through the alternate output of a node if the desired output is not available. This feature, and the regularity of the MSN structure would be suitable for constructing a “defect-tolerant” wafer-scale system. We use this architecture for multipoint ATM communications, and propose the internal structure of each node. At every node, shared buffers are utilized to increase the system performance and reduce the number of deflections. A simulation for the wafer-scale system is also conducted to measure delay and average number of deflections in the presence of defective nodes
Keywords
asynchronous transfer mode; delays; electronic switching systems; telecommunication network reliability; telecommunication network routing; wafer-scale integration; Manhattan-street network; defect-tolerant WSI switching system; delay; multipoint ATM communications; torus structure; wafer-scale ATM switching system; Application software; Asynchronous transfer mode; Buffer storage; Computer networks; Delay; Network topology; Routing; Switching systems; System performance; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-2467-6
Type
conf
DOI
10.1109/ICWSI.1995.515452
Filename
515452
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