DocumentCode
2397548
Title
Proceedings 2005 IEEE International Workshop on Current & Defect Based Testing (DBT 2005) - front matter
fYear
2005
fDate
1-1 May 2005
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Conference_Location
Palm Springs, CA
Print_ISBN
1-4244-0034-1
Type
conf
DOI
10.1109/DBT.2005.1531292
Filename
1531292
Link To Document