Title :
Near and far fields analysis from flat cables
Author :
Tanabe, Shinji ; Shiraki, Yasuhiro ; Murata, Yuichiro
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
Abstract :
The electromagnetic radiation from flat cables (flexible printed circuit:FPC) which have different structures are analyzed using a three dimensional finite element method (3D-FEM). The electric fields at 3 m from the FPC were calculated by an integration method using the calculated E and H values inside of the FEM region and Green´s function. The calculated radiation from a microstrip structure FPC is smaller than that from a single layer FPC by about 17 dB in near field, 25 dB at 3 m from the FPC. The results were compared with E fields measured by antenna at 3 m from the FPC. The measured difference between the microstrip FPC and the single layer FPC is 11.5 dB. Adopting a microstrip structure FPC is effective in drastically reducing the EMI noise from the cable
Keywords :
Green´s function methods; electric field measurement; electromagnetic interference; finite element analysis; integration; magnetic field measurement; microstrip lines; printed circuits; transmission line theory; 3 m; 3D-FEM; EMI noise reduction; Green´s function; antenna; electric field measurement; electric fields; far fields analysis; flat cables; flexible printed circuit; integration method; magnetic field measurement; microstrip structure; near fields analysis; three dimensional finite element method; Antenna measurements; Cables; Electromagnetic analysis; Electromagnetic interference; Electromagnetic radiation; Finite element methods; Flexible printed circuits; Green´s function methods; Microstrip; Near-field radiation pattern;
Conference_Titel :
Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4140-6
DOI :
10.1109/ISEMC.1997.667717
