DocumentCode :
2397623
Title :
Data size reduction for clustering-based binning of ICs using principal component analysis (PCA)
Author :
Banthia, Ashish S. ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO
fYear :
2005
fDate :
1-1 May 2005
Firstpage :
24
Lastpage :
30
Abstract :
Accurate binning of ICs using analog characteristics such as IDDQ requires using data from a number of vectors. From this data, information needs to be extracted using a method that will yield sufficiently high resolution. Using a large volume of data can require significant computation time. If n analog measurements are made for each chip, the data has n dimensions. However the measured IDDQ values for a chip can he highly correlated. We examine an approach based on principal component analysis (PCA) for reducing the data size while preserving almost all of the information. PCA transforms the data by extracting statistically independent components and arranging them in the order of relative significance. Using industrial IDDQ data we found that often n-dimensional data can be reduced to a single dimension with no substantial change in the clusters identified
Keywords :
data reduction; integrated circuit testing; pattern clustering; principal component analysis; analog characteristics; analog measurements; data size reduction; integrated circuit binning; n-dimensional data reduction; principal component analysis; Computer science; Data mining; Energy consumption; Frequency; Geometry; Personal communication networks; Principal component analysis; Production; Semiconductor device measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Conference_Location :
Palm Springs, CA
Print_ISBN :
1-4244-0034-1
Type :
conf
DOI :
10.1109/DBT.2005.1531298
Filename :
1531298
Link To Document :
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