Title :
Structural test with functional characteristics
Author :
Nadeau-Dosti, B. ; Mahmud, Mufti ; Cote, J.-F. ; Maamaril, F.
Author_Institution :
Logic Vision Inc, San Jose, CA
Abstract :
A novel structural test clocking architecture is proposed to reproduce characteristics of the functional mode of operation that are essential to a high-quality test. Bursts of functional mode clocks are controlled to provide accurate timing tests taking into account functional timing constraints such as multi-cycle paths and false paths. Any mix of asynchronous and synchronous clocks is supported. Long term (Idd, temperature) and short term (IR-drop) power characteristics related to circuit activity are independently controlled
Keywords :
circuit testing; clocks; timing; asynchronous clocks; functional mode clocks; functional timing constraints; high-quality test; multicycle paths; structural test clocking architecture; synchronous clocks; timing tests; Circuit testing; Clocks; Current supplies; Frequency; Logic testing; Pipeline processing; Semiconductor device testing; Temperature control; Timing; Voltage;
Conference_Titel :
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Conference_Location :
Palm Springs, CA
Print_ISBN :
1-4244-0034-1
DOI :
10.1109/DBT.2005.1531302
