DocumentCode
2398105
Title
Work-in-process control in a continuous-flow manufacturing line
Author
Toof, Carolyn E. ; Weston, Diane E.
Author_Institution
IM, Essex Junction, VT, USA
fYear
1991
fDate
21-23 Oct 1991
Firstpage
39
Lastpage
42
Abstract
During the past year, IBM´s semiconductor manufacturing facility in Essex Junction, Vermont, has made a transition from business as usual to continuous-flow manufacturing (CFM). This transition made the traditional tools used for line control ineffective and required new and more creative ways of managing work in process (WIP). This facility manufactures high-volume logic and numerous chips with multiple part numbers. There are many technologies which share tools and processes. The authors describe the system developed to control WIP in such a facility. During the last two years, cycle times have decreased, and wafer final test yields have improved. Outs per operator have more than doubled as a result of productivity improvements. Customer weekly and monthly serviceability for both volume and part-number mix has improved significantly. The number of late lots in the line has decreased as a result of CFM and WIP control actions
Keywords
integrated circuit manufacture; process control; production testing; semiconductor device manufacture; WIP; continuous-flow manufacturing line; cycle times; high-volume logic; multiple part numbers; productivity improvements; semiconductor manufacturing facility; serviceability; wafer final test yields; work in process; Aging; Control systems; Job shop scheduling; Logic; Manufacturing processes; Marine vehicles; Personnel; Process control; Production facilities; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1991. ASMC 91 Proceedings. IEEE/SEMI 1991
Conference_Location
Boston, MA
Print_ISBN
0-7803-0152-8
Type
conf
DOI
10.1109/ASMC.1991.167379
Filename
167379
Link To Document