DocumentCode
2398273
Title
Hierarchical Testing of Complex Digital Systems
Author
Hahanov, Vladimir ; Obrizan, Volodymyr ; Yeliseev, Vladimir ; Ghribi, Wade
Author_Institution
Kharkiv Nat. Univ. of Radio Electron., Kharkiv
fYear
2006
fDate
Feb. 28 2006-March 4 2006
Firstpage
426
Lastpage
429
Abstract
This paper offers approach to complex digital system testing based on hierarchy scaling during diagnosis experiment. Several models of testing are proposed. Main principles of testing system organization are given. Such approach allows significant reducing overall system testing and diagnostics time.
Keywords
IEEE standards; circuit testing; digital signal processing chips; digital systems; complex digital system testing; complex digital systems; diagnosis experiment; hierarchical testing; hierarchy scaling; Circuit faults; Circuit testing; Digital systems; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Logic testing; Network-on-a-chip; Standards organizations; System testing; IEEE 1500 SECT; diagnostics; program-technical complex; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference
Conference_Location
Lviv-Slavsko
Print_ISBN
966-553-507-2
Type
conf
DOI
10.1109/TCSET.2006.4404571
Filename
4404571
Link To Document