• DocumentCode
    2399342
  • Title

    Modeling, simulation, and design methodology of the interconnect and packaging of an ultra-high speed source synchronous bus

  • Author

    Arabi, Tawfik ; Jones, Jeff ; Taylor, Greg ; Riendeau, D.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    1998
  • fDate
    26-28 Oct 1998
  • Firstpage
    8
  • Lastpage
    11
  • Abstract
    In this paper, we describe the modeling, simulation and design methodology of the interconnect and packaging for a 400 MHz L2 level cache. Since the bus is source synchronous or “self timed”, the signal integrity, and hence the electrical performance of the package and board interconnects is a major limiter to the bus speed. To this end, we present circuit design techniques to alleviate packaging problems such as the implementation of a dynamically controlled driver impedance and edge rate. The timing equations for the source synchronous I/O bus are written in terms of the basic fundamental limitations of the silicon, package, and board processes. The interconnect performance modeling and simulation methodologies used to optimize these equations are described
  • Keywords
    cache storage; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; integrated memory circuits; system buses; timing; 400 MHz; L2 level cache; board interconnects; board process limitations; bus speed; circuit design techniques; design methodology; dynamically controlled driver impedance; edge rate; electrical performance; fundamental limitations; interconnect; interconnect performance modeling; interconnect simulation; modeling; package; package limitations; packaging; self timed bus; signal integrity; silicon limitations; simulation; source synchronous I/O bus; timing equations; timing equations optimization; ultra-high speed source synchronous bus; Circuit synthesis; Design methodology; Driver circuits; Equations; Impedance; Integrated circuit interconnections; Optimization methods; Packaging; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
  • Conference_Location
    West Point, NY
  • Print_ISBN
    0-7803-4965-2
  • Type

    conf

  • DOI
    10.1109/EPEP.1998.733489
  • Filename
    733489