Title :
Worst Case Design and Datasheet Generation Techniques for Analog Silicon Compilers
Author :
Goffart, B. ; Jongsma, J. ; Degrauwe, M.
Author_Institution :
CSEM, Neuchatel, Switzerland
Abstract :
Worst case design and datasheet generation techniques for analog circuits, based on analytic expressions, are presented. They take into account temperature, bias current and technology parameter fluctuations. The techniques which have been implemented in an analog design system, operating with "design strategies" as well as "numerical optimization methods", do not degrade significantly the design time.
Keywords :
circuit layout CAD; elemental semiconductors; silicon; Si; analog circuits; analog design system; analog silicon compilers; analytic expressions; bias current; datasheet generation techniques; numerical optimization methods; technology parameter fluctuations; Analog circuits; Circuit analysis; Circuit synthesis; Computer aided software engineering; Degradation; Fluctuations; Optimization methods; Silicon compiler; Temperature distribution; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1989. ESSCIRC '89. Proceedings of the 15th European
Conference_Location :
Vienna
Print_ISBN :
3-85403-101-7
DOI :
10.1109/ESSCIRC.1989.5468146
