DocumentCode
2399511
Title
Worst Case Design and Datasheet Generation Techniques for Analog Silicon Compilers
Author
Goffart, B. ; Jongsma, J. ; Degrauwe, M.
Author_Institution
CSEM, Neuchatel, Switzerland
fYear
1989
fDate
20-22 Sept. 1989
Firstpage
125
Lastpage
128
Abstract
Worst case design and datasheet generation techniques for analog circuits, based on analytic expressions, are presented. They take into account temperature, bias current and technology parameter fluctuations. The techniques which have been implemented in an analog design system, operating with "design strategies" as well as "numerical optimization methods", do not degrade significantly the design time.
Keywords
circuit layout CAD; elemental semiconductors; silicon; Si; analog circuits; analog design system; analog silicon compilers; analytic expressions; bias current; datasheet generation techniques; numerical optimization methods; technology parameter fluctuations; Analog circuits; Circuit analysis; Circuit synthesis; Computer aided software engineering; Degradation; Fluctuations; Optimization methods; Silicon compiler; Temperature distribution; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1989. ESSCIRC '89. Proceedings of the 15th European
Conference_Location
Vienna
Print_ISBN
3-85403-101-7
Type
conf
DOI
10.1109/ESSCIRC.1989.5468146
Filename
5468146
Link To Document