Time-resolved optical nonlinearity measurement by a two color pump-probe ellipsometry in InAs quantum dot waveguide

Author

Kanamoto, Kyozo ; Nakamura, Hitoshi ; Nakamura, Yusui ; Sugimoto, Yoshimasa ; Asakawa, Kiyoshi ; Ishikawa, Hiroshi

Author_Institution

Femtosecond Technol. Res. Assoc., Tsukuba, Japan

Volume

2

fYear

2003

fDate

27-28 Oct. 2003

Firstpage

561

Abstract

We have developed a two color pump-probe ellipsometry for the measurement of the optical nonlinear phase shift in a waveguide with quantum dot (QD) core layers. The key point of the method is to utilize the large polarization-dependent property in the optical nonlinearity arising from a flat-dome-like shape of the QDs. In this paper we report the time resolved behavior of the nonlinear response in the QD waveguides obtained by this method. Optical phase shift of more than π/2 rad was obtained by a pumping of 30 pJ/μm². Delay time dependence of the phase shift is discussed in connection with the carrier dynamics.

Keywords

III-V semiconductors; delays; ellipsometry; high-speed optical techniques; indium compounds; light polarisation; nonlinear optics; optical phase shifters; optical pumping; optical variables measurement; optical waveguides; probes; semiconductor quantum dots; InAs; InAs quantum dot waveguide; QD core layer; carrier dynamics; color pump-probe ellipsometry; delay time dependence; flat-dome-like QD shape; optical nonlinear phase shift; polarization-dependent property; time-resolved optical nonlinearity measurement; Delay; Ellipsometry; Nonlinear optics; Optical pumping; Optical waveguides; Polarization; Probes; Quantum dots; US Department of Transportation; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE

ISSN

1092-8081

Print_ISBN

0-7803-7888-1

Type

conf

DOI

10.1109/LEOS.2003.1252923

Filename

1252923