Title :
A similarity measure between unordered vector sets with application to image categorization
Author :
Liu, Yan ; Perronnin, Florent
Author_Institution :
Textual & Visual Pattern Anal., Xerox Res. Centre Eur. (XRCE), Grenoble
Abstract :
We present a novel approach to compute the similarity between two unordered variable-sized vector sets. To solve this problem, several authors have proposed to model each vector set with a Gaussian mixture model (GMM) and to compute a probabilistic measure of similarity between the GMMs. The main contribution of this paper is to model each vector set with a GMM adapted from a common ldquouniversalrdquo GMM using the maximum a posteriori (MAP) criterion. The advantages of this approach are twofold. MAP provides a more accurate estimate of the GMM parameters compared to standard maximum likelihood estimation (MLE) in the challenging case where the cardinality of the vector set is small. Moreover, there is a correspondence between the Gaussians of two GMMs adapted from a common distribution and one can take advantage of this fact to compute efficiently the probabilistic similarity. This work is applied to the image categorization problem: images are modeled as bags of low-level features and classification is performed using a kernel classifier based on the proposed similarity measure. Experimental results on the PASCAL VOC 2006 and VOC 2007 databases show the excellent performance of our approach.
Keywords :
Gaussian processes; image classification; maximum likelihood estimation; Gaussian mixture model; PASCAL VOC 2006-2007 database; image categorization; maximum a posteriori criterion; maximum likelihood estimation; probabilistic measure; probabilistic similarity; similarity measure; unordered variable-sized vector sets; unordered vector sets; Costs; Distributed computing; Feature extraction; Histograms; Kernel; Maximum likelihood estimation; Pattern analysis; Performance evaluation; Sampling methods; Vocabulary;
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2008.4587600