DocumentCode
2399732
Title
Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies
Author
Kayal, Aymen
Author_Institution
Res. Inst., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
fYear
1997
fDate
27-31 Jul 1997
Firstpage
149
Lastpage
153
Abstract
This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts´ assessments. The findings revealed that the TCT provided good assessment in each situation
Keywords
electronics industry; patents; product development; research and development management; semiconductor technology; superconductivity; patent-based technology indicator; semiconductor technologies; superconductor technologies; technological progress measurement; technology cycle time indicator; Aggregates; Art; Laboratories; Minerals; Petroleum; Production; Research and development; Semiconductor device manufacture; Time measurement; Trademarks;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
Conference_Location
Portland, OR
Print_ISBN
0-7803-3574-0
Type
conf
DOI
10.1109/PICMET.1997.653299
Filename
653299
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