• DocumentCode
    2399732
  • Title

    Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies

  • Author

    Kayal, Aymen

  • Author_Institution
    Res. Inst., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • fYear
    1997
  • fDate
    27-31 Jul 1997
  • Firstpage
    149
  • Lastpage
    153
  • Abstract
    This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts´ assessments. The findings revealed that the TCT provided good assessment in each situation
  • Keywords
    electronics industry; patents; product development; research and development management; semiconductor technology; superconductivity; patent-based technology indicator; semiconductor technologies; superconductor technologies; technological progress measurement; technology cycle time indicator; Aggregates; Art; Laboratories; Minerals; Petroleum; Production; Research and development; Semiconductor device manufacture; Time measurement; Trademarks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
  • Conference_Location
    Portland, OR
  • Print_ISBN
    0-7803-3574-0
  • Type

    conf

  • DOI
    10.1109/PICMET.1997.653299
  • Filename
    653299