DocumentCode
2399757
Title
Exchangeability test on phase-change disks and testers
Author
Ito, Takao ; Kubo, T. ; Yamada, Shigeru
fYear
1994
fDate
28 Aug-2 Sep 1994
Firstpage
357
Lastpage
357
Keywords
Disk recording; Drives; Indium tin oxide; Materials testing; Optical noise; Optical recording; Optical sensors; Precision engineering; Servomechanisms; Standardization;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 1994 Conference on
Print_ISBN
0-7803-1789-0
Type
conf
DOI
10.1109/CLEOE.1994.636632
Filename
636632
Link To Document