Title :
Reliability testing methodology of broadly tunable laser chips for external cavity lasers
Author :
Konoplev, O. ; Heim, P.J.S. ; Merritt, S. ; Bowler, D. ; Hu, Y. ; Saini, S. ; Wilson, S. ; Leavitt, R. ; Stone, D. ; Dagenais, M.
Author_Institution :
Covega Inc., Jessup, MD, USA
Abstract :
The reliability testing methodology of 1550 nm, sub-200 nm broadly tunable InP-based laser chips for external cavity lasers is discussed. The article summarizes FIT rate achieved and degradation observed with multiple manufactured lots.
Keywords :
III-V semiconductors; indium compounds; laser cavity resonators; laser reliability; laser tuning; semiconductor lasers; 1550 nm; InP; InP laser chip; broadly tunable laser chip; external cavity laser; reliability testing; Degradation; Gratings; Laser tuning; Life testing; Optical resonators; Power generation; Semiconductor device reliability; Semiconductor device testing; Semiconductor lasers; Tunable circuits and devices;
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7888-1
DOI :
10.1109/LEOS.2003.1252958
