• DocumentCode
    2400354
  • Title

    Visibility in bad weather from a single image

  • Author

    Tan, Robby T.

  • Author_Institution
    Commun. & Signal Process. Group, Imperial Coll. London, London
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Bad weather, such as fog and haze, can significantly degrade the visibility of a scene. Optically, this is due to the substantial presence of particles in the atmosphere that absorb and scatter light. In computer vision, the absorption and scattering processes are commonly modeled by a linear combination of the direct attenuation and the airlight. Based on this model, a few methods have been proposed, and most of them require multiple input images of a scene, which have either different degrees of polarization or different atmospheric conditions. This requirement is the main drawback of these methods, since in many situations, it is difficult to be fulfilled. To resolve the problem, we introduce an automated method that only requires a single input image. This method is based on two basic observations: first, images with enhanced visibility (or clear-day images) have more contrast than images plagued by bad weather; second, airlight whose variation mainly depends on the distance of objects to the viewer, tends to be smooth. Relying on these two observations, we develop a cost function in the framework of Markov random fields, which can be efficiently optimized by various techniques, such as graph-cuts or belief propagation. The method does not require the geometrical information of the input image, and is applicable for both color and gray images.
  • Keywords
    Markov processes; computer vision; graph theory; image colour analysis; visibility; Markov random fields; absorption process; bad weather visibility; belief propagation; color image; computer vision; graph-cuts; gray images; scattering process; single image; Absorption; Atmosphere; Atmospheric modeling; Computer vision; Degradation; Layout; Light scattering; Optical attenuators; Optical scattering; Particle scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587643
  • Filename
    4587643