A Compact Bi-Direction Scannable a-Si:H TFT Gate Driver

Author

Congwei Liao ; Zhijin Hu ; Dai, Dao-Qing ; Chung, Shi-Uk ; Jen, T.S. ; Shengdong Zhang

Author_Institution

Sch. of Electron. & Comput. Eng., Peking Univ., Shenzhen, China

Volume

11

Issue

1

fYear

2015

fDate

Jan. 2015

Firstpage

3

Lastpage

5

Abstract

An integrated a-Si:H thin-film transistors (TFTs) gate driver on array with both forward and backward scanning function is proposed. The single stage of the gate driver only consists of seven TFTs. The bi-direction scannable function is just realized by controlling the turning-on sequence of two input TFTs. Both scanning modes use the same driving TFT for pulling-up and pulling-down the output voltage and the same circuit unit for holding the low level. The proposed gate driver is fabricated in the 4.5 G TFT production line, and the measurements with the fabricated drivers verify the feasibility of the proposed driver.

Keywords

driver circuits; elemental semiconductors; hydrogen; silicon; thin film transistors; transistor circuits; 4.5 G TFT production line; Si:H; backward scanning function; compact bidirection scannable TFT gate driver function; forward scanning function; integrated thin-film transistors; output voltage; turning-on sequence control; Amorphous silicon; Bidirectional control; Clocks; Integrated circuit reliability; Logic gates; Thin film transistors; A-Si:H; bi-directional scan; gate driver; thin-film transistors (TFTs);

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2014.2366782

Filename

6945240