Title :
Manufacturing optimization improvements leveraging SEMI E94-1107
Author :
Maxim, Carmen ; Goss, Raymond ; Rothe, Jan ; Drozda, Michael ; Adhikari, Diwas
Author_Institution :
GLOBALFOUNDRIES, Austin, TX, USA
Abstract :
In 2007, SEMI´s information and control committee approved a new version of SEMI E94 (E94-1107). This version relaxed the connection between carriers and control job for processing wafers and formally introduced a way to redirect material based on host requests after the beginning of processing. As simulations indicate, this new standard is impacting several fab performance indicators, including throughput, cycle time, yield, and just-in-time (JIT) customer response. This paper discusses possible use cases leveraging the new standard feature and the resulting performance improvements.
Keywords :
integrated circuit yield; just-in-time; monolithic integrated circuits; semiconductor device manufacture; semiconductor industry; standards; SEMI E94-1107 standard; cycle time; fab performance indicators; just-in-time customer response; manufacturing optimization improvements; throughput; wafer processing; yield; Costs; Flexible manufacturing systems; Foundries; Manufacturing processes; Metrology; Process control; Qualifications; Semiconductor device manufacture; Throughput; Time measurement;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2009. ASMC '09. IEEE/SEMI
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-3614-9
Electronic_ISBN :
1078-8743
DOI :
10.1109/ASMC.2009.5155956