Title :
Measurement of stray capacitance and inductance due to assembly variations in radio frequency circuit boards
Author :
Heutmaker, Michael S. ; Fletcher, Linda M. ; Sohn, John E.
Abstract :
A microstrip directional coupler is used as a test circuit to measure the stray´ capacitance and inductance due to solder flux residue deposits and solder joint geometry variations at frequencies up to 4.8 GHz. The stray capacitance is less than 50 femtofarads, and the absolute value of the stray inductance is less than 100 picohenries.
Keywords :
Assembly; Capacitance measurement; Circuit testing; Coupling circuits; Directional couplers; Frequency measurement; Inductance measurement; Microstrip; Parasitic capacitance; Radio frequency;
Conference_Titel :
Sarnoff Symposium, 1995., IEEE Princeton Section
Conference_Location :
Princeton, NJ, USA
DOI :
10.1109/SARNOF.1995.636712
