Title :
Selective growth of an InGaAs QW active layer in a photonic crystal optical microcavity
Author :
Elarde, Victor C. ; Kim, Yong Kwan ; Choquette, Kent D. ; Coleman, James J.
Author_Institution :
Micro & Nanotechnol., Illinois Univ., Urbana, IL, USA
Abstract :
The use of an InGaAs quantum well as the active layer of a photonic crystal microcavity is problematic in that the perforation of the quantum well creates nonradiative recombination sites. We propose to eliminate this problem by spatially restricting the well to exist only in the photonic crystal defect region. By inhibiting growth of the quantum well in the region that will be etched during the formation of the photonic crystal, we anticipate greatly diminished nonradiative recombination. The crystal is grown by a three-step metal-organic chemical vapor deposition growth process employing nanolithographic selective area epitaxy for the quantum well active layer followed by a second lithographic layer and a dry etch process to form the photonic crystal. The quantum well is designed to luminescence between 1025 and 1050 due to growth enhancement effects created by the selective area epitaxy. The photonic crystal parameters are designed to vary the photonic bandgap over this range.
Keywords :
III-V semiconductors; MOCVD; cathodoluminescence; crystal defects; etching; gallium arsenide; indium compounds; micro-optics; microcavities; nanolithography; photonic band gap; photonic crystals; semiconductor quantum wells; InGaAs; InGaAs QW active layer; InGaAs quantum well; dry etch process; growth enhancement effect; luminescence; metal-organic chemical vapor deposition growth; nanolithographic selective area epitaxy; nonradiative recombination site; photonic bandgap; photonic crystal defect; photonic crystal optical microcavity; Chemical vapor deposition; Dry etching; Epitaxial growth; Indium gallium arsenide; Luminescence; Microcavities; Photonic band gap; Photonic crystals; Radiative recombination; Spontaneous emission;
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7888-1
DOI :
10.1109/LEOS.2003.1252991