DocumentCode :
2400751
Title :
The HDR-RF test waveform - an innovative risk reduction product for FPGA-based SATCOM modems
Author :
Torres, Jose
Author_Institution :
MITRE Corp., Bedford, MA
fYear :
2008
fDate :
16-19 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Transponded Ka-band military satellite communications (SATCOM) enables airborne Intelligence, Surveillance, and Reconnaissance (ISR) platforms, such as the Global Hawk unmanned aerial vehicle (UAV), to deliver up to 274 Mbps of high data rate sensor information to beyond line-of-sight (BLOS) ground terminals. The high data rate radio frequency (HDR-RF) ground modem program has leveraged the MITRE programmable radio technology (PRT) laboratory to provide an innovative approach that has enabled development of the HDR-RF ground modem long before availability of the Ka-band operational waveform. This capability is critical to providing the government confidence the HDR-RF ground modems are designed with adequate resources to host the operational waveform in the future. This paper describes the developed risk reduction product consisting of a powerful reuse strategy for waveforms implemented using field programmable gate array (FPGA) devices, a complex high data rate (HDR) test waveform, and a test asset used as the gold standard for interoperability testing with the HDR-RF ground modems.
Keywords :
field programmable gate arrays; military communication; modems; satellite communication; FPGA-based SATCOM modems; Global Hawk unmanned aerial vehicle; HDR-RF test waveform; Ka-band military satellite communications; Ka-band operational waveform; beyond line-of-sight ground terminals; field programmable gate array; high data rate radio frequency; high data rate sensor information; risk reduction product; Field programmable gate arrays; Intelligent sensors; Intelligent vehicles; Military satellites; Modems; Reconnaissance; Risk management; Surveillance; Testing; Unmanned aerial vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2008. MILCOM 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2676-8
Electronic_ISBN :
978-1-4244-2677-5
Type :
conf
DOI :
10.1109/MILCOM.2008.4753501
Filename :
4753501
Link To Document :
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