• DocumentCode
    2400787
  • Title

    Large-scale manifold learning

  • Author

    Talwalkar, Ameet ; Kumar, Sanjiv ; Rowley, Henry

  • Author_Institution
    Courant Inst., New York, NY
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper examines the problem of extracting low-dimensional manifold structure given millions of high-dimensional face images. Specifically, we address the computational challenges of nonlinear dimensionality reduction via Isomap and Laplacian Eigenmaps, using a graph containing about 18 million nodes and 65 million edges. Since most manifold learning techniques rely on spectral decomposition, we first analyze two approximate spectral decomposition techniques for large dense matrices (Nystrom and column-sampling), providing the first direct theoretical and empirical comparison between these techniques. We next show extensive experiments on learning low-dimensional embeddings for two large face datasets: CMU-PIE (35 thousand faces) and a web dataset (18 million faces). Our comparisons show that the Nystrom approximation is superior to the column-sampling method. Furthermore, approximate Isomap tends to perform better than Laplacian Eigenmaps on both clustering and classification with the labeled CMU-PIE dataset.
  • Keywords
    approximation theory; face recognition; graph theory; learning (artificial intelligence); Isomap; Laplacian Eigenmaps; Nystrom approximation; column-sampling method; high-dimensional face images; large-scale manifold learning; nonlinear dimensionality reduction; Image sampling; Iterative methods; Laplace equations; Large-scale systems; Learning systems; Matrix decomposition; Principal component analysis; Sampling methods; Sparse matrices; Spectral analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587670
  • Filename
    4587670