Title :
Extreme wide-temperature range 8-bit digital to analog converter in bulk CMOS process
Author :
Greig, Kevin S. ; Chodavarapu, Vamsy P.
Abstract :
An 8-bit 20k samples-per-second digital-to-analog converter (DAC) capable of operating within the extreme wide-temperature range was developed in a 130nm bulk CMOS technology. Emphasis was placed on the design of a temperature insensitive operational amplifier (op-amp) used in DAC. A novel approach for common mode-feedback with a nested miller compensation op-amp was used in combination with other established methods to mitigate the negative effects of high temperatures on bulk CMOS devices. At 225 °C, the op-amp had a power consumption of 647 μW, with a DC gain of 76 dB, a unity gain bandwidth of 56.8 MHz and a phase margin of 100 degrees. The functionality of the 8-bit DAC was characterized at all operating corners over the extreme wide-temperature range.
Keywords :
CMOS integrated circuits; digital-analogue conversion; operational amplifiers; bulk CMOS process; digital-analog converter; extreme wide temperature range DAC; gain 76 dB; power 647 muW; size 130 nm; temperature 225 C; temperature insensitive operational amplifier; Data models; Digital-analog conversion; Gain; Power demand; Resistors; Temperature distribution; Temperature sensors;
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2014 IEEE 27th Canadian Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4799-3099-9
DOI :
10.1109/CCECE.2014.6901016