DocumentCode
2400850
Title
A Coverage Relationship Model for Test Case Selection and Ranking for Multi-version Software
Author
Tsai, W.T. ; Zhou, Xinyu ; Paul, Raymond A. ; Chen, Yinong ; Bai, Xiaoying
Author_Institution
Arizona State Univ., Tempe
fYear
2007
fDate
14-16 Nov. 2007
Firstpage
105
Lastpage
112
Abstract
Testing a group of software artifacts that implement the same specification can be time consuming, especially when the test case repository is large. In the meantime, some test cases may cover the same aspects in the software, thus it is not necessary to apply all the test cases. This paper proposes a model-based adaptive test (MAT) case selection and ranking technique to eliminate duplicate test cases, i.e., test cases with the similar coverage, and rank the test cases according to their potency and coverage. This technique can be applied in various domains where multiple versions of applications are available to test, such as web service testing, n-version applications, regression testing, and standard-based testing. The MAT is based a statistical model based on earlier testing results, and the model can determine the next sets of test cases to minimize the testing effort. The MAT is then applied to testing of multi-versioned web services and the results shows that the MAT can reduce testing effort while still maintain the effectiveness of testing.
Keywords
Web services; program testing; statistical analysis; Web services; coverage relationship model; model-based adaptive test; multiversion software; ranking technique; software artifacts; statistical model; test case selection; Application software; Computer science; Software standards; Software testing; Standards development; Standards publication; Statistical analysis; System testing; USA Councils; Web services; Adaptive testing; group; regression testing; statistical testing; test case selection and ranking; testing; web services.;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering Symposium, 2007. HASE '07. 10th IEEE
Conference_Location
Plano, TX
ISSN
1530-2059
Print_ISBN
978-0-7695-3043-7
Type
conf
DOI
10.1109/HASE.2007.64
Filename
4404732
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