DocumentCode
2401135
Title
Pattern-Based Modeling and Analysis of Failsafe Fault-Tolerance in UML
Author
Ebnenasir, Ali ; Cheng, Betty H C
Author_Institution
Michigan Technol. Univ., Houghton
fYear
2007
fDate
14-16 Nov. 2007
Firstpage
275
Lastpage
282
Abstract
In order to facilitate incremental modeling and analysis of fault-tolerant embedded systems, we introduce an object analysis pattern, called the detector pattern, that provides a reusable strategy for capturing the requirements of failsafe fault-tolerance in an existing conceptual model, where a failsafe system satisfies its safety requirements even when faults occur. We also present a method that (i) uses the detector pattern to help create a behavioral model of a failsafe fault-tolerant system in UML, (ii) generates and model checks formal models of UML state diagrams of the fault-tolerant system, and (Hi) visualizes the model checking results in terms of the UML diagrams to facilitate model refinement. We demonstrate our analysis method in the context of an industrial automotive application.
Keywords
Unified Modeling Language; fault tolerant computing; formal specification; object-oriented programming; program diagnostics; program verification; security of data; software reusability; UML diagrams; UML state diagrams; behavioral model; detector pattern; failsafe fault-tolerance; failsafe system; fault-tolerant embedded systems; fault-tolerant system; incremental modeling; model checking; model checks formal models; model refinement; object analysis pattern; pattern-based analysis; pattern-based modeling; requirements capturing; reusable strategy; safety requirements; Detectors; Embedded system; Failure analysis; Fault detection; Fault tolerance; Fault tolerant systems; Object detection; Pattern analysis; Safety; Unified modeling language; Detector; Fault-Tolerance; FormalMethods; Requirements Analysis; UML;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering Symposium, 2007. HASE '07. 10th IEEE
Conference_Location
Plano, TX
ISSN
1530-2059
Print_ISBN
978-0-7695-3043-7
Type
conf
DOI
10.1109/HASE.2007.47
Filename
4404750
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