DocumentCode :
2401296
Title :
Rapid analytical optimization of eddy current shield thickness for associated loss minimization in electrical machines
Author :
Shah, Manoj R. ; Lee, Sang Bin
Author_Institution :
Lab. of Electr. Machines & Drives, General Electr. Global Res. Center, Schenectady, NY
fYear :
2005
fDate :
15-15 May 2005
Firstpage :
1304
Lastpage :
1310
Abstract :
A copper or another high conductivity shield is often used in solid rotor machines for reducing armature reaction space and time harmonic induced surface eddy current losses in the rotor. Since finite element simulations can make the design process very time consuming and complicated, an analytical model for calculating the surface losses is derived in this paper. A set of equations is derived based on Maxwell´s equations for a general case and applied to a solid rotor synchronous machine. The simulation results show that the model can serve as an effective screening tool for determining the optimal shield thickness for minimizing the surface losses, especially for high speed machines operating in conjunction with power electronic converters
Keywords :
Maxwell equations; eddy current losses; finite element analysis; harmonics suppression; optimisation; power convertors; rotors; synchronous machines; Maxwell equations; analytical optimization; armature reaction space reduction; eddy current losses; eddy current shield thickness; finite element simulations; loss minimization; optimal shield thickness; power electronic converters; solid rotor synchronous machine; surface loss reduction; time harmonic reduction; Analytical models; Armature; Conductivity; Copper; Eddy currents; Finite element methods; Maxwell equations; Process design; Solids; Synchronous machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Machines and Drives, 2005 IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-8987-5
Electronic_ISBN :
0-7803-8988-3
Type :
conf
DOI :
10.1109/IEMDC.2005.195891
Filename :
1531509
Link To Document :
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