• DocumentCode
    2401451
  • Title

    Photometric stereo with coherent outlier handling and confidence estimation

  • Author

    Verbiest, Frank ; Gool, Luc Van

  • Author_Institution
    KU Leuven, Leuven
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In photometric stereo a robust method is required to deal with outliers, such as shadows and non-Lambertian reflections. In this paper we rely on a probabilistic imaging model that distinguishes between inliers and outliers, and formulate the problem as a Maximum-Likelihood estimation problem. To signal which imaging model to use a hidden binary inlier map is introduced, which, to account for the fact that inlier/outlier pixels typically group together, is modelled as a Markov Random Field. To make inference of model parameters and hidden variables tractable a mean field Expectation-Maximization (EM) algorithm is used. If for each pixel we add the scaled normal, i.e. albedo and normal combined, to the model parameters, it would not be possible to obtain a confidence estimate in the result. Instead, each scaled normal is added as a hidden variable, the distribution of which, approximated by a Gaussian, is also estimated in the EM algorithm. The covariance matrix of the recovered approximate Gaussian distribution serves as a confidence estimate of the scaled normal. We demonstrate experimentally the effectiveness or our approach.
  • Keywords
    Gaussian distribution; Markov processes; approximation theory; covariance matrices; expectation-maximisation algorithm; inference mechanisms; stereo image processing; Markov random field; approximated Gaussian distribution; coherent outlier handling; confidence estimation; covariance matrix; hidden binary inlier map; inlier/outlier pixel; maximum-likelihood estimation problem; mean field expectation-maximization algorithm; model parameter inference; photometric stereo; probabilistic imaging model; Equations; Gaussian distribution; Geometry; Lighting; Markov random fields; Optical reflection; Photometry; Pixel; Robustness; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587712
  • Filename
    4587712