• DocumentCode
    2401524
  • Title

    Complementary IBS: Application specific error correction for PUFs

  • Author

    Hiller, Matthias ; Merli, Dominik ; Stumpf, Frederic ; Sigl, Georg

  • Author_Institution
    Inst. for Security in Inf. Technol., Tech. Univ. Munchen, Munich, Germany
  • fYear
    2012
  • fDate
    3-4 June 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this contribution, we present Complementary Index-Based Syndrome coding (C-IBS), a new and flexible fuzzy embedder for Physical Unclonable Functions (PUFs). C-IBS applies IBS several times to the same group of PUF outputs. The additional parameter permits an application specific tradeoff between error correction capability and implementation complexity. We demonstrate the flexibility of C-IBS by providing efficient solutions that optimize error correction, helper data size or decoder complexity for a well-known key generation scenario. Further, we present encoding criteria that characterize C-IBS fuzzy embedders in general. A hardware implementation is compared to previous work and substantiates the efficiency of C-IBS. The low implementation complexity of C-IBS facilitates the usage for resource constrained cryptographic applications.
  • Keywords
    computational complexity; cryptography; error correction codes; fuzzy set theory; C-IBS fuzzy embedders; PUF; application specific error correction; complementary IBS; complementary index-based syndrome coding; decoder complexity; error correction capability; flexible fuzzy embedder; helper data size; implementation complexity; key generation scenario; physical unclonable functions; resource constrained cryptographic applications; Decoding; Encoding; Error correction codes; Error probability; Field programmable gate arrays; Hardware; Security; ASIC; Error Correction; FPGA; Fuzzy Embedder; Index-Based Syndrome Coding; Physical Unclonable Function (PUF);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hardware-Oriented Security and Trust (HOST), 2012 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4673-2341-3
  • Type

    conf

  • DOI
    10.1109/HST.2012.6224310
  • Filename
    6224310