• DocumentCode
    2401529
  • Title

    In Vivo characterization of skin using a weiner nonlinear stochastic system identification method

  • Author

    Chen, Yi ; Hunter, Ian W.

  • Author_Institution
    Dept. of Mech. Eng., BioInstrumentation Lab., Cambridge, MA, USA
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    6010
  • Lastpage
    6013
  • Abstract
    This paper describes an indentometer device used to identify the linear dynamic and nonlinear properties of skin and underlying tissue using an in vivo test. The device uses a Lorentz force actuator to apply a dynamic force to the skin and measures the resulting displacement. It was found that the skin could be modeled as a Wiener system (i.e. a linear dynamic system followed by a static nonlinearity). Using a stochastic nonlinear system identification technique, the method presented in this paper was able to identify the dynamic linear and static nonlinear mechanical parameters of the indentometer-skin system within 2 to 4 seconds. The shape of the nonlinearity was found to vary depending on the area of the skin that was tested. We show that the device can repeatably distinguish between different areas of human tissue for multiple test subjects.
  • Keywords
    actuators; biomechanics; skin; stochastic processes; Lorentz force actuator; Weiner nonlinear stochastic system identification method; human tissue; in vivo test; indentometer-skin system; skin dynamic force; static nonlinearity; stochastic nonlinear system identification technique; Algorithms; Computer Simulation; Data Interpretation, Statistical; Elastic Modulus; Equipment Design; Equipment Failure Analysis; Hardness; Hardness Tests; Models, Biological; Nonlinear Dynamics; Palpation; Physical Examination; Physical Stimulation; Sensitivity and Specificity; Skin Physiological Phenomena; Stochastic Processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5334028
  • Filename
    5334028