Title :
Bit string analysis of Physical Unclonable Functions based on resistance variations in metals and transistors
Author :
Ju, Jing ; Plusquellic, Jim ; Chakraborty, Raj ; Rad, Reza
Author_Institution :
Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
Security mechanisms such as encryption, authentication and feature activation depend on the integrity of embedded secret keys. The mechanism by which these `digital secrets´ are stored within Integrated Circuits (ICs) is changing from EPROMs and/or fuse technology to Physical Unclonable Functions (PUFs). PUFs leverage the naturally occurring manufacturing variations within each IC to produce repeatedly random digital identifiers. In this paper, we analyze the quality of the bit strings generated by PUFs that leverage resistance variations in 1) the power grid metal wires and transistor on-resistance in 60 copies of a 90 nm chip and 2) in the power grid metal wires of 58 copies of a 65 nm chip.
Keywords :
EPROM; integrated circuit manufacture; public key cryptography; EPROM; PUF; authentication; bit string analysis; bit strings quality; digital secrets; embedded secret keys; encryption; feature activation; fuse technology; integrated circuits; metals; naturally occurring manufacturing variations; physical unclonable functions; power grid metal wires; repeatedly random digital identifiers; resistance variations; security mechanisms; size 65 nm; size 90 nm; transistor on-resistance; transistors; Arrays; Metals; Power grids; Resistance; Semiconductor device measurement; Voltage measurement; Wires; Physical Unclonable Function; metal resistance variations; power grid;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2012 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-2341-3
DOI :
10.1109/HST.2012.6224312
