Testable design and testing of high-speed superconductor microelectronics

Author

Kerkhoff, Hans G. ; Joseph, Arun A. ; Heuvelmans, Sander

Author_Institution

MESA+ Res. Inst., CADTES, Enschede, Netherlands

fYear

2002

fDate

2002

Firstpage

8

Lastpage

12

Abstract

True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions

Keywords

alumina; analogue-digital conversion; built-in self test; cellular radio; design for testability; fault simulation; hardware description languages; high-speed integrated circuits; integrated circuit testing; niobium; superconducting integrated circuits; superconductor-insulator-superconductor devices; BIST; Josephson junction; Nb-Al₂O₃-Nb; Nb-based delta ADCs; Nb/Al₂O₃/Nb trilayer; VHDL simulated behaviour; defect detection; extreme conditions; extremely fast data converters; high-speed superconductor microelectronics; mixed-level fault simulation; software-defined radio cellular base stations; testable design; Base stations; Bridges; Built-in self-test; Josephson junctions; Microelectronics; Niobium; Semiconductor device testing; Software testing; Transceivers; Wireless communication;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Conference_Location

Christchurch

Print_ISBN

0-7695-1453-7

Type

conf

DOI

10.1109/DELTA.2002.994580

Filename

994580