Title :
Testable design and testing of high-speed superconductor microelectronics
Author :
Kerkhoff, Hans G. ; Joseph, Arun A. ; Heuvelmans, Sander
Author_Institution :
MESA+ Res. Inst., CADTES, Enschede, Netherlands
Abstract :
True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions
Keywords :
alumina; analogue-digital conversion; built-in self test; cellular radio; design for testability; fault simulation; hardware description languages; high-speed integrated circuits; integrated circuit testing; niobium; superconducting integrated circuits; superconductor-insulator-superconductor devices; BIST; Josephson junction; Nb-Al2O3-Nb; Nb-based delta ADCs; Nb/Al2O3/Nb trilayer; VHDL simulated behaviour; defect detection; extreme conditions; extremely fast data converters; high-speed superconductor microelectronics; mixed-level fault simulation; software-defined radio cellular base stations; testable design; Base stations; Bridges; Built-in self-test; Josephson junctions; Microelectronics; Niobium; Semiconductor device testing; Software testing; Transceivers; Wireless communication;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994580
