Title :
Observer-based test of analog linear time-invariant circuits
Author :
Guo, Zhen ; Savir, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
An observer-based test methodology is proposed for detecting parametric faults in analog linear time-invariant circuits. A Kalman filter is used to reduce the measurement noise. Experiments conducted on an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in general. We show that, in the analog test domain, a fault-free parameter may mask the detection of a faulty parameter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected
Keywords :
Kalman filters; analogue circuits; circuit testing; fault diagnosis; linear network analysis; low-pass filters; observers; 2-pole low-pass filter; Kalman filter; analog linear time-invariant circuits; fault-free parameter; faulty parameter detection; measurement noise; observer-based test methodology; parametric fault detection; Character generation; Circuit testing; Conferences; Electronic equipment testing; Feedback circuits;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994581
