Electrical material properties from a free-space time-domain RF absorber reflectivity measurement system

The scattering information obtained from the measurements of selected test structures is used to extract the relative permittivities of the various dielectric layers. Tests have been successfully conducted on single and multiple-layer dielectric panels, from which good estimates of material properties have been obtained. Results have been obtained in tests performed at both normal and oblique incidence. In addition, an edge-effect removal algorithm that significantly improves the estimated dielectric constant for small panels has recently been developed