DocumentCode :
2401582
Title :
Near duplicate image identification with patially Aligned Pyramid Matching
Author :
Xu, Dong ; Cham, Tat-Jen ; Yan, Shuicheng ; Chang, Shih-Fu
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
7
Abstract :
A new framework, termed spatially aligned pyramid matching, is proposed for near duplicate image identification. The proposed method robustly handles spatial shifts as well as scale changes. Images are divided into both overlapped and non-overlapped blocks over multiple levels. In the first matching stage, pairwise distances between blocks from the examined image pair are computed using SIFT features and Earth Moverpsilas distance (EMD). In the second stage, multiple alignment hypotheses that consider piecewise spatial shifts and scale variation are postulated and resolved using integer-flow EMD. Two application scenarios are addressed - retrieval ranking and binary classification. For retrieval ranking, a pyramid-based scheme is constructed to fuse matching results from different partition levels. For binary classification, a novel generalized neighborhood component analysis method is formulated that can be effectively used in tandem with SVMs to select the most critical matching components. The proposed methods are shown to clearly outperform existing methods through extensive testing on the Columbia near duplicate image database and another new dataset.
Keywords :
image matching; image retrieval; visual databases; Earth Mover distance; binary classification; image database; integer-flow EMD; multiple alignment hypotheses; near duplicate image identification; nonoverlapped blocks; pairwise distances; piecewise spatial shifts; retrieval ranking; spatially aligned pyramid matching; Earth; Fuses; Image databases; Layout; Photometry; Rendering (computer graphics); Robustness; Spatial resolution; Stochastic processes; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
ISSN :
1063-6919
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2008.4587720
Filename :
4587720
Link To Document :
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