Title :
Efficient look-ahead load margin and voltage profiles contingency analysis using the tangent vector index method
Author :
Chu, Chia-Chi ; Lee, Sheng-Huei ; Chuang, Hsun-Yuan
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Tao Yuan, Taiwan
Abstract :
Look-ahead contingency analysis involves how to predict the near-term load margin and voltage profiles with respect to voltage collapse points of a large number of post-outage systems. In this paper, an efficient curve-fitting-based algorithm is developed. Instead of approximating the load margin as a quadratic function of voltage profiles with three unknown coefficients near the collapse point, we reformulate it as a quadratic function of voltage tangent vector profiles with only two unknown coefficients. Only two consecutive voltage tangent vector profiles are needed in the proposed formulation which involves less computational cost in comparisons with those required in existing methods. A numerical stable method to calculate the tangent vector is proposed first. Based on the load margin approximations predicted by the tangent vector, a general framework for look-ahead contingency selection, evaluation, and ranking is developed. We evaluate this method on several power systems. Simulation results demonstrate the efficiency and the accuracy of the proposed method
Keywords :
curve fitting; load (electric); power system dynamic stability; collapse point; curve-fitting-based algorithm; load margin approximation; look-ahead contingency ranking; look-ahead contingency selection; look-ahead load margin; near-term load margin; post-outage systems; power systems; quadratic function; tangent vector index method; voltage collapse points; voltage profiles; voltage profiles contingency analysis; voltage tangent vector profiles; Computational efficiency; Energy management; Load flow; Power system analysis computing; Power system modeling; Power system simulation; Power system stability; Stability analysis; Testing; Voltage;
Conference_Titel :
Power Engineering Society Summer Meeting, 2000. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6420-1
DOI :
10.1109/PESS.2000.867507