DocumentCode
2401868
Title
Multispectral optical imaging of skin-lesions for detection of malignant melanomas
Author
Dhawan, Atam P. ; D´Alessandro, Brian ; Patwardhan, Sachin ; Mullani, Nizar
Author_Institution
Dept. of Electr.&Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
5352
Lastpage
5355
Abstract
Optical imaging of skin-lesions for early detection and management of the most fatal skin-cancer malignant melanoma is of significant interest in mass screening of skin-lesions with high-risk population. Surface illumination based optical imaging methods such as epiluminescence light microscopy (ELM) through ldquoDermascopyrdquo has shown a significant potential in improving early diagnosis of malignant melanomas. Limitations of surface reflectance based imaging systems have been realized in analyzing images for important vascular and depth dependent information. We have developed a novel optical imaging system, the Nevoscope, that uses multispectral transillumination as to provide images of skin-lesions showing sub-surface pigmentation as well as vascular architecture based blood volume information. This paper presents multispectral Nevoscope transillumination method to compare and analyze ratiometric measurements to epiluminescence imaging for its ability to discriminate malignant melanomas from dysplastic nevi and other normal skin-lesions.
Keywords
bioluminescence; biomedical optical imaging; cancer; medical image processing; optical microscopy; reflectivity; skin; Nevoscope; dermascopy; dysplastic nevi; epiluminescence light microscopy; high-risk population; malignant melanoma detection; mass screening; multispectral optical imaging; multispectral transillumination; skin lesions; surface illumination; surface reflectance based imaging system; Dermoscopy; Humans; Melanoma; Skin Neoplasms; Transillumination;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5334045
Filename
5334045
Link To Document