DocumentCode :
2401868
Title :
Multispectral optical imaging of skin-lesions for detection of malignant melanomas
Author :
Dhawan, Atam P. ; D´Alessandro, Brian ; Patwardhan, Sachin ; Mullani, Nizar
Author_Institution :
Dept. of Electr.&Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
5352
Lastpage :
5355
Abstract :
Optical imaging of skin-lesions for early detection and management of the most fatal skin-cancer malignant melanoma is of significant interest in mass screening of skin-lesions with high-risk population. Surface illumination based optical imaging methods such as epiluminescence light microscopy (ELM) through ldquoDermascopyrdquo has shown a significant potential in improving early diagnosis of malignant melanomas. Limitations of surface reflectance based imaging systems have been realized in analyzing images for important vascular and depth dependent information. We have developed a novel optical imaging system, the Nevoscope, that uses multispectral transillumination as to provide images of skin-lesions showing sub-surface pigmentation as well as vascular architecture based blood volume information. This paper presents multispectral Nevoscope transillumination method to compare and analyze ratiometric measurements to epiluminescence imaging for its ability to discriminate malignant melanomas from dysplastic nevi and other normal skin-lesions.
Keywords :
bioluminescence; biomedical optical imaging; cancer; medical image processing; optical microscopy; reflectivity; skin; Nevoscope; dermascopy; dysplastic nevi; epiluminescence light microscopy; high-risk population; malignant melanoma detection; mass screening; multispectral optical imaging; multispectral transillumination; skin lesions; surface illumination; surface reflectance based imaging system; Dermoscopy; Humans; Melanoma; Skin Neoplasms; Transillumination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5334045
Filename :
5334045
Link To Document :
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