Title :
On charge sensors for FIB attack detection
Author :
Helfmeier, Clemens ; Boit, Christian ; Kerst, Uwe
Author_Institution :
Berlin Univ. of Technol., Berlin, Germany
Abstract :
A new sensor of Focused Ion Beam (FIB) attacks on security sensitive ICs is presented. The function is based on the FIB navigation process mandatory for FIB attacks, which covers a wide chip area, but deposits only a low charge density. Detecting this very low charge with extremely sensitive local charge sensors allows a loose distribution over the IC. The performance requirements of the charge sensors are specified. A new circuit design is presented capable of storing the information about FIB attacks permanently inside the circuit even while the chip remains unpowered. The circuits are realized on silicon level and characterized in depth. The necessary sensitivity is verified.
Keywords :
CMOS integrated circuits; cryptography; focused ion beam technology; integrated circuit design; sensors; CMOS integrated circuits; FIB attack detection; FIB navigation process; Si; circuit design; cryptography; focused ion beam attack; loose distribution; low charge density; security sensitive IC; sensitive local charge sensors; silicon level; Antennas; Capacitance; Capacitors; Ion beams; Navigation; Sensors; Transistors; CMOS integrated circuits; Cryptography hardware; Integrated circuit modeling; Ion beams; Surface charging;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2012 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-2341-3
DOI :
10.1109/HST.2012.6224332
