Title :
Flash memory built-in self-test using March-like algorithms
Author :
Yeh, Jen-Chieh ; Wu, Chi-Feng ; Cheng, Kuo-Liang ; Chou, Yung-Fa ; Huang, Chih-Tsun ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Flash memories are a type of non-volatile memory based on floating-gate transistors. The use of commodity and embedded flash memories are growing rapidly as we enter the system-on-chip (SOC) era. Conventional tests for flash memories are usually ad hoc-the test procedure is developed for a specific design. We propose improved March-like algorithms (i.e., March FT) for both bit-oriented and word-oriented flash memory; to cover the disturbance faults derived from the IEEE 1005 Standard, as well as conventional faults. A novel flash memory fault simulator is used to analyze and generate the test algorithms. In addition, we present BIST designs for two industrial flash memories. The area overhead is only about 3% for a medium-sized flash memory
Keywords :
application specific integrated circuits; built-in self test; fault diagnosis; flash memories; integrated circuit testing; BIST designs; IEEE 1005 Standard; March FT; March-like algorithms; area overhead; bit-oriented memory; built-in self-test; commodity memories; disturbance faults; embedded memories; flash memory; floating-gate transistors; nonvolatile memory; system-on-chip era; test procedure; word-oriented memory; Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Flash memory; Nonvolatile memory; Random access memory; System testing; System-on-a-chip;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994602
