• DocumentCode
    2401943
  • Title

    Power optimization of combinational circuits by input transformations

  • Author

    Gopalakrishnan, Chandramouli ; Katkoori, Srinivas

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    154
  • Lastpage
    158
  • Abstract
    We present a novel approach for power minimization of CMOS combinational circuits based on transforming power-expensive inputs to functionally equivalent power-optimal inputs. We assume that the environment information is available in the form of either word-level statistics or a long representative input sequence. From the environment information, we derive power-effective input transformations that will save power for any input stream that satisfies the environment properties. We synthesize a transform module that is appended at the primary inputs of the module. The proposed approach can be applied at the system-level by propagating environment information to the primary outputs of the system and then deriving transform circuits for each module. As an example of realworld application, we present results for DCT module in a JPEG compression chip with different input environments (e.g.. face recognition dataset, weather forecasting). Experimental results are highly encouraging
  • Keywords
    CMOS logic circuits; VLSI; circuit optimisation; combinational circuits; data compression; discrete cosine transforms; logic CAD; minimisation of switching nets; CMOS; JPEG compression chip; combinational circuits; face recognition dataset; functionally equivalent power-optimal inputs; input stream; power optimization; power-effective input transformations; primary outputs; representative input sequence; transform module; weather forecasting; word-level statistics; Character generation; Circuit testing; Combinational circuits; Conferences; Electronic equipment testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
  • Conference_Location
    Christchurch
  • Print_ISBN
    0-7695-1453-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2002.994605
  • Filename
    994605