DocumentCode
2401983
Title
Improvement in Estimating Snowpack Properties with SSM/I Data and Land Cover Using Artificial Neural Networks
Author
Azar, Amir E. ; Ghedira, H. ; Lakhankar, T. ; Khanbilvardi, R.
Author_Institution
NOAA-CREST, City Univ. of New York, NY
fYear
0
fDate
0-0 0
Firstpage
154
Lastpage
159
Abstract
The goal of this study is to develop an algorithm to estimate snow water equivalent (SWE) in Great Lakes area based on a three year time series of SSM/I data along with corresponding ground truth data. An assortment of SSM/I EASE-GRID pixels was selected for time series analysis. The pixels were selected based on the amount of snow, latitude, and land cover. Two types of ground truth data were used: 1 - point-based snow depth observations from NCDC; 2 - grid based SNODAS-SWE dataset, produced by NOHRSC. To account for land cover variation in a quantitative way a NDVI was used. To do the time series analysis, three scattering signatures of GTVN (19V-37V), GTH (19H-37H), and SSI (22V-85V) were derived. The analysis shows at lower latitudes of the study area there is no correlation between GTH and GTVN vs snow depth. On the other hand SSI shows an average correlation of 75 percent with snow depth in lower latitudes makes it suitable for shallow snow. In model development a multi-linear algorithm was defined to estimate SWE using NDVI values along with the location of the pixels as classification criteria. The results show up to 60 percent correlation between estimated and ground truth SWE
Keywords
neural nets; remote sensing; snow; terrain mapping; time series; Great Lakes area; Michigan; Minnesota; SSM/I EASE-GRID pixels; USA; Wisconsin; artificial neural networks; grid based SNODAS-SWE dataset; multilinear algorithm; point-based snow depth observations; snow depth; snow water equivalent; snowpack properties; time series analysis; Artificial neural networks; Brightness temperature; Frequency; Intelligent networks; Lakes; Polarization; Snow; Spatial resolution; Testing; Time series analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE MicroRad, 2006
Conference_Location
SanJuan
Print_ISBN
0-7803-9417-8
Type
conf
DOI
10.1109/MICRAD.2006.1677080
Filename
1677080
Link To Document