Title :
Physical Internal Gain Mechanisms of ZnO-Based Nanorod Ultraviolet Photodetectors
Author :
Tzu-Shun Lin ; Chia-Hsun Chen ; Ching-Ting Lee
Author_Institution :
Inst. of Nanotechnol. & Microsyst. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
The structure of the ZnO-based p-ZnO:LiNO3/ i-ZnO/n-ZnO:In nanorod ultraviolet (UV) photodetectors was grown on sapphire substrates using the vapor cooling condensation system. To study the internal gain mechanisms of the photodetectors, the ZnO-based nanorods were photochemically passivated for different time and operated under various environments to vary the defect density resided on the sidewall surface of the ZnO-based nanorods. The mechanisms of the internal gain, which was attributed to the surface band bending effect of the ZnO-based nanorods induced from the sidewall surface defects and the absorbed oxygen molecules, were thus derived. The specific detectivity of 3.25×1015 cmHz1/2W-1 was obtained for the ZnO-based nanorod UV photodetectors treated with the photoelectrochemical passivation process for 2 min.
Keywords :
II-VI semiconductors; defect states; indium; lithium compounds; nanophotonics; nanorods; passivation; photodetectors; photoelectrochemistry; ultraviolet detectors; wide band gap semiconductors; zinc compounds; Al2O3; ZnO-based nanorod ultraviolet photodetectors; ZnO:LiNO3-ZnO-ZnO:In; absorbed oxygen molecules; defect density; photoelectrochemical passivation process; physical internal gain mechanisms; sapphire substrates; sidewall surface defects; surface band bending effect; time 2 min; vapor cooling condensation system; Films; Noise; Optical surface waves; Passivation; Photodetectors; Zinc oxide; Efficiency-gain product; ZnO-based nanorod ultraviolet photodetectors; internal gain mechanism; photoelectrochemical passivation; vapor cooling condensation system;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2015.2391276